Acetone, CMOS for microelectronic, J.T.Baker®

Supplier: Avantor
Danger

Synonyms: 2-Propanone, DMK, Propanone, Dimethyl ketone

9015-09EA 0 INR
9015-09 9015-10 9015-2J
Acetone, CMOS for microelectronic, J.T.Baker®
Acetone
Formula: CH₃COCH₃
MW: 58,08 g/mol
Boiling Pt: 56,2 °C (1013 hPa)
Melting Pt: –95,4 °C
Density: 0,792 g/cm³ (20 °C)
Flash Pt: <–20 °C (closed cup)
Storage Temperature: Ambient
MDL Number: MFCD00008765
CAS Number: 67-64-1
EINECS: 200-662-2
UN: 1090
ADR: 3,II
REACH: 01-2119471330-49
Merck Index: 13,00067
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Specification Test Results

For Microelectronic Use = 99.5 %
Assay ((CH₃)₂CO) (by GC, corrected for water) ≥ 99.5 %
Color (APHA) ≤ 10
Residue after Evaporation ≤ 5 ppm
Titrable Acid (µeq/g) ≤ 0.3
Titrable Base (µeq/g) ≤ 0.5
Water (H₂O) ≤ 0.5 %
Solubility in H₂O Passes Test
Chloride (Cl) ≤ 0.2 ppm
Phosphate (PO₄) ≤ 0.05 ppm
Trace Impurities - Aluminum (Al) ≤ 50.0 ppb
Arsenic and Antimony (as As) ≤ 5.0 ppb
Trace Impurities - Barium (Ba) ≤ 20.0 ppb
Trace Impurities - Beryllium (Be) ≤ 10.0 ppb
Trace Impurities - Bismuth (Bi) ≤ 20.0 ppb
Trace Impurities - Boron (B) ≤ 10.0 ppb
Trace Impurities - Cadmium (Cd) ≤ 10.0 ppb
Trace Impurities - Calcium (Ca) ≤ 25.0 ppb
Trace Impurities - Chromium (Cr) ≤ 10.0 ppb
Trace Impurities - Cobalt (Co) ≤ 10.0 ppb
Trace Impurities - Copper (Cu) ≤ 10.0 ppb
Trace Impurities - Gallium (Ga) ≤ 10.0 ppb
Trace Impurities - Germanium (Ge) ≤ 10.0 ppb
Trace Impurities - Gold (Au) ≤ 20 ppb
Trace Impurities - Iron (Fe) ≤ 20.0 ppb
Trace Impurities - Lead (Pb) ≤ 10.0 ppb
Trace Impurities - Lithium (Li) ≤ 10.0 ppb
Trace Impurities - Magnesium (Mg) ≤ 20 ppb
Trace Impurities - Manganese (Mn) ≤ 10.0 ppb
Trace Impurities - Molybdenum (Mo) ≤ 10.0 ppb
Trace Impurities - Nickel (Ni) ≤ 10.0 ppb
Trace Impurities - Niobium (Nb) ≤ 50.0 ppb
Trace Impurities - Potassium (K) ≤ 10.0 ppb
Trace Impurities - Silicon (Si) ≤ 50 ppb
Trace Impurities - Silver (Ag) ≤ 10.0 ppb
Trace Impurities - Sodium (Na) ≤ 10.0 ppb
Trace Impurities - Strontium (Sr) ≤ 10.0 ppb
Trace Impurities - Tantalum (Ta) ≤ 50.0 ppb
Trace Impurities - Thallium (Tl) ≤ 10.0 ppb
Trace Impurities - Tin (Sn) ≤ 20.0 ppb
Trace Impurities - Titanium (Ti) ≤ 10.0 ppb
Trace Impurities - Vanadium (V) ≤ 10.0 ppb
Trace Impurities - Zinc (Zn) ≤ 20.0 ppb
Trace Impurities - Zirconium (Zr) ≤ 10.0 ppb
Particle Count at point of fill - 0.5 µm and greater (Rion KS42AF or equivalent) ≤ 150 par/ml
Particle Count at point of fill - 1.0 µm and greater (Rion KS42AF or equivalent) ≤ 25 par/ml

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